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Marius Bazu

Institutul National de Cercetare Dezvoltare in Microtehnologie, Bucuresti, Romania

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Born: 1948

Interests: semiconductors, reliability, microsystems

Dr. Marius Bazu, Head of the Reliability Laboratory of IMT-Bucharest, with recent research interests in microsystem reliability and concurrent engineering. Author of two books published by Artech House (2009)and Springer Verlag (1999) and of more than 100 papers and contributions in journals (IEEE Trans.on Reliability, Journal of Electrochem. Soc, Solid State Phenomena, etc.) and to major reliability conferences (Annual Reliability and Maintainability Symp., Probabilistic Safety Assessment and Management, ESREL, etc.). Leader of the Reliability Cluster of NoE "Patent-DfMM" (European project FP6/IST, 2004-2007) and referent of the journals IEEE Transactions on Reliability, IEEE Transactions on Components and Packaging, IEEE Electron Device Letters, MIcroelectronics Reliability and Sensors.

Selected publications:
• Titu Bajenescu, Marius Bazu. Reliability Components for Electronic Systems. Artech House, 2009.
• Titu Bajenescu, Marius Bazu. Reliability of Electronic Components. Springer Verlag, 1999.


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