Ad Astra Awards
Ad Astra Journal
Science library
White book
University rankings
Who's who
Publications
Theses and dissertations
Ad Astra association
 
Press releases
News
Events
Funding opportunities
 
Login
Registration
 
>> Românã
 
   
 

Titu Bajenescu, Marius Bazu. Reliability of Electronic Components. Springer Verlag, 1999.

Keywords: Reliability, Failure, Characterisation, Testing, Semiconductors

Posted by Marius Bazu

Back

   
© Ad Astra 2001-2013